An on-chip sensor to measure and compensate static NBTI-induced degradation in analog circuits

Syed Askari, Mehrdad Nourani. An on-chip sensor to measure and compensate static NBTI-induced degradation in analog circuits. Microelectronics Reliability, 53(2):245-253, 2013. [doi]

Authors

Syed Askari

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Mehrdad Nourani

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