Syed Askari, Mehrdad Nourani. An on-chip sensor to measure and compensate static NBTI-induced degradation in analog circuits. Microelectronics Reliability, 53(2):245-253, 2013. [doi]
@article{AskariN13,
title = {An on-chip sensor to measure and compensate static NBTI-induced degradation in analog circuits},
author = {Syed Askari and Mehrdad Nourani},
year = {2013},
doi = {10.1016/j.microrel.2012.08.014},
url = {http://dx.doi.org/10.1016/j.microrel.2012.08.014},
researchr = {https://researchr.org/publication/AskariN13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {2},
pages = {245-253},
}