Mitigating Stuck Cell Failures in MLC NAND Flash Memory via Inferred Erasure Decoding

Chaudhry Adnan Aslam, Cai Kui, Yong Liang Guan. Mitigating Stuck Cell Failures in MLC NAND Flash Memory via Inferred Erasure Decoding. IEEE Trans. VLSI Syst., 25(8):2285-2295, 2017. [doi]

@article{AslamKG17,
  title = {Mitigating Stuck Cell Failures in MLC NAND Flash Memory via Inferred Erasure Decoding},
  author = {Chaudhry Adnan Aslam and Cai Kui and Yong Liang Guan},
  year = {2017},
  doi = {10.1109/TVLSI.2017.2683536},
  url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2017.2683536},
  researchr = {https://researchr.org/publication/AslamKG17},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {25},
  number = {8},
  pages = {2285-2295},
}