Stephan P. Athan, David L. Landis, Sami A. Al-Arian. A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 118-123, IEEE Computer Society, 1996. [doi]
Abstract is missing.