A doubly-fed induction generator test facility for grid fault ride-through analysis

David J. Atkinson, Graham Pannell, Wenping Cao, Bashar Zahawi, Tusitha Abeyasekera, Milutin Jovanovic. A doubly-fed induction generator test facility for grid fault ride-through analysis. IEEE Instrum. Meas. Mag., 15(6):20-27, 2012. [doi]

Abstract

Abstract is missing.