Amir Attarha, Mehrdad Nourani. Built-In-Chip Testing of Voltage Overshoots in High-Speed SoCs. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 111-116, IEEE Computer Society, 2001. [doi]
@inproceedings{AttarhaN01:0, title = {Built-In-Chip Testing of Voltage Overshoots in High-Speed SoCs}, author = {Amir Attarha and Mehrdad Nourani}, year = {2001}, url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220111abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/AttarhaN01%3A0}, cites = {0}, citedby = {0}, pages = {111-116}, booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-1122-8}, }