A 2.6 mV/b Resolution, 1.2 GHz Throughput, All-Digital Voltage Droop Monitor Using Coupled Ring Oscillators in Intel 4 CMOS

Charles Augustine, Pascal Meinerzhagen, Wootaek Lim, A. Veerabathini, M. Bright, K. Mojjada, Jim Tschanz, Muhammad M. Khellah, Vivek De. A 2.6 mV/b Resolution, 1.2 GHz Throughput, All-Digital Voltage Droop Monitor Using Coupled Ring Oscillators in Intel 4 CMOS. In 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023. pages 1-2, IEEE, 2023. [doi]

@inproceedings{AugustineMLVBMT23,
  title = {A 2.6 mV/b Resolution, 1.2 GHz Throughput, All-Digital Voltage Droop Monitor Using Coupled Ring Oscillators in Intel 4 CMOS},
  author = {Charles Augustine and Pascal Meinerzhagen and Wootaek Lim and A. Veerabathini and M. Bright and K. Mojjada and Jim Tschanz and Muhammad M. Khellah and Vivek De},
  year = {2023},
  doi = {10.23919/VLSITechnologyandCir57934.2023.10185254},
  url = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185254},
  researchr = {https://researchr.org/publication/AugustineMLVBMT23},
  cites = {0},
  citedby = {0},
  pages = {1-2},
  booktitle = {2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023},
  publisher = {IEEE},
  isbn = {978-4-86348-806-9},
}