Creating A Mixed-Signal Simulation Capability for Concurrent IC Design and Test Program Development - researchr publication authors

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Tom Austin. Creating A Mixed-Signal Simulation Capability for Concurrent IC Design and Test Program Development. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 125-132, IEEE Computer Society, 1993.

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