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Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level

J. L. Autran, D. Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, E. Yakushev, S. Rozov, P. Loaiza, G. Warot, M. Zampaolo. Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level. Microelectronics Reliability, 50(9-11):1822-1831, 2010. [doi]

Authors

J. L. Autran

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D. Munteanu

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Philippe Roche

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Gilles Gasiot

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S. Martinie

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S. Uznanski

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S. Sauze

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S. Semikh

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E. Yakushev

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S. Rozov

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P. Loaiza

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G. Warot

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M. Zampaolo

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