Gilles Gasiot - researchr alias

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Viewing Publication 1 - 13 from 13

2017

Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMsS. Moindjie, Jean-Luc Autran, Daniela Munteanu, Gilles Gasiot, Philippe Roche. mr, 76:53-57, 2017. [doi]

2016

®-A53 using static biasing-anticipationFady Abouzeid, Christophe Bernicot, Sylvain Clerc, Jean-Marc Daveau, Gilles Gasiot, Daniel Noblet, Dimitri Soussan, Philippe Roche. esscirc 2016: 37-40 [doi]

2015

28nm FD-SOI technology and design platform for sub-10pJ/cycle and SER-immune 32bits processorsFady Abouzeid, Sylvain Clerc, Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Damien Croain, Gilles Gasiot, Dimitri Soussan, Philippe Roche. esscirc 2015: 108-111 [doi]

ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de BureJean-Luc Autran, Daniela Munteanu, S. Moindjie, T. Saad Saoud, S. Sauze, Gilles Gasiot, P. Roche. mr, 55(9-10):1506-1511, 2015. [doi]

Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation testCyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, Fady Abouzeid, Sylvain Clerc, Lirida A. B. Naviner, Philippe Roche. irps 2015: 12 [doi]

Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMsGilles Gasiot, Dimitri Soussan, Jean-Luc Autran, Victor Malherbe, Philippe Roche. irps 2015: 2 [doi]

Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysisVictor Malherbe, Gilles Gasiot, Dimitri Soussan, Aurelien Patris, Jean-Luc Autran, Philippe Roche. irps 2015: 11 [doi]

2014

Real-time soft-error rate measurements: A reviewJ. L. Autran, D. Munteanu, Philippe Roche, Gilles Gasiot. mr, 54(8):1455-1476, 2014. [doi]

Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuitsJean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, Philippe Roche. mr, 54(9-10):2278-2283, 2014. [doi]

2012

A 0.32V, 55fJ per bit access energy, CMOS 65nm bit-interleaved SRAM with radiation Soft Error toleranceSylvain Clerc, Fady Abouzeid, Gilles Gasiot, David Gauthier, Dimitri Soussan, Philippe Roche. icicdt 2012: 1-4 [doi]

A 65nm SRAM achieving 250mV retention and 350mV, 1MHz, 55fJ/bit access energy, with bit-interleaved radiation Soft Error toleranceSylvain Clerc, Fady Abouzeid, Gilles Gasiot, David Gauthier, Philippe Roche. esscirc 2012: 313-316 [doi]

2010

Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground levelJ. L. Autran, D. Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, E. Yakushev, S. Rozov, P. Loaiza, G. Warot, M. Zampaolo. mr, 50(9-11):1822-1831, 2010. [doi]

2008

Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOSPhilippe Roche, Mark Lysinger, Gilles Gasiot, Jean-Marc Daveau, Mehdi Zamanian, Pierre Dautriche. iolts 2008: 46-48 [doi]

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