Aspects for Trace Monitoring

Pavel Avgustinov, Eric Bodden, Elnar Hajiyev, Laurie J. Hendren, Ondřej Lhoták, Oege de Moor, Neil Ongkingco, Damien Sereni, Ganesh Sittampalam, Julian Tibble, Mathieu Verbaere. Aspects for Trace Monitoring. In Klaus Havelund, Manuel Núñez, Grigore Rosu, Burkhart Wolff, editors, Formal Approaches to Software Testing and Runtime Verification, First Combined International Workshops, FATES 2006 and RV 2006, Seattle, WA, USA, August 15-16, 2006, Revised Selected Papers. Volume 4262 of Lecture Notes in Computer Science, pages 20-39, Springer, 2006. [doi]

Authors

Pavel Avgustinov

Identified as Pavel Avgustinov
(Oxford University
)

Eric Bodden

Identified as Eric Bodden

Elnar Hajiyev

This author has not been identified. Look up 'Elnar Hajiyev' in Google

Laurie J. Hendren

Identified as Laurie J. Hendren
(McGill University
)

Ondrej Lhoták

Identified as Ondřej Lhoták

Oege de Moor

Identified as Oege de Moor

Neil Ongkingco

This author has not been identified. Look up 'Neil Ongkingco' in Google

Damien Sereni

Identified as Damien Sereni
(Oxford University
)

Ganesh Sittampalam

Identified as Ganesh Sittampalam
(Oxford University
)

Julian Tibble

This author has not been identified. Look up 'Julian Tibble' in Google

Mathieu Verbaere

This author has not been identified. Look up 'Mathieu Verbaere' in Google