Built-In-Self-Test of Analogue Circuits Using Optimised Fault Sets and Transient Response Testing - researchr publication authors

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N. Axelos, J. Watson, D. Taylor, A. Platts. Built-In-Self-Test of Analogue Circuits Using Optimised Fault Sets and Transient Response Testing. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 135-139, IEEE Computer Society, 2002. [doi]

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