Wavelet based statistical detection of salient points by the exploitation of the interscale redundancies

Walid Ayadi, Amel Benazza-Benyahia. Wavelet based statistical detection of salient points by the exploitation of the interscale redundancies. In Proceedings of the International Conference on Image Processing, ICIP 2009, 7-10 November 2009, Cairo, Egypt. pages 1001-1004, IEEE, 2009. [doi]

Abstract

Abstract is missing.