Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test

M. Ayadi, Olivier Briat, R. Lallemand, A. Eddahech, R. German, Gerard Coquery, Jean-Michel Vinassa. Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test. Microelectronics Reliability, 54(9-10):1944-1948, 2014. [doi]

Abstract

Abstract is missing.