High-Q Timing and Inertial Measurement Unit Chip (TIMU) with 3D Wafer-Level Packaging

Farrokh Ayazi, Haoran Wen, Yaesuk Jeong, Pranav Gupta, Anosh Daruwalla, Chang-Shun Liu. High-Q Timing and Inertial Measurement Unit Chip (TIMU) with 3D Wafer-Level Packaging. In IEEE Custom Integrated Circuits Conference, CICC 2019, Austin, TX, USA, April 14-17, 2019. pages 1-8, IEEE, 2019. [doi]

Authors

Farrokh Ayazi

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Haoran Wen

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Yaesuk Jeong

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Pranav Gupta

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Anosh Daruwalla

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Chang-Shun Liu

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