Analog Circuit Testing Using Auto Regressive Moving Average Models - researchr publication authors

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Jeffrey Ayres, Michael L. Bushnell. Analog Circuit Testing Using Auto Regressive Moving Average Models. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 775-780, IEEE Computer Society, 2007. [doi]

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