Samaneh Azadi, Jeremy Maitin-Shepard, Pieter Abbeel. Optimization-Based Artifact Correction for Electron Microscopy Image Stacks. In David J. Fleet, Tomás Pajdla, Bernt Schiele, Tinne Tuytelaars, editors, Computer Vision - ECCV 2014 - 13th European Conference, Zurich, Switzerland, September 6-12, 2014, Proceedings, Part II. Volume 8690 of Lecture Notes in Computer Science, pages 219-235, Springer, 2014. [doi]
Abstract is missing.