Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. J. Electronic Testing, 17(3-4):255-266, 2001. [doi]
@article{AzaisBBR01a,
title = {Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST},
author = {Florence Azaïs and Serge Bernard and Yves Bertrand and Michel Renovell},
year = {2001},
doi = {10.1023/A:1012211328531},
url = {http://dx.doi.org/10.1023/A:1012211328531},
tags = {optimization, testing},
researchr = {https://researchr.org/publication/AzaisBBR01a},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {17},
number = {3-4},
pages = {255-266},
}