Mohamed Azimane. High-Quality Memory Test. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. IEEE Computer Society, 2006. [doi]
@inproceedings{Azimane06, title = {High-Quality Memory Test}, author = {Mohamed Azimane}, year = {2006}, doi = {10.1109/MTDT.2006.17}, url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.17}, tags = {testing}, researchr = {https://researchr.org/publication/Azimane06}, cites = {0}, citedby = {0}, booktitle = {14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan}, publisher = {IEEE Computer Society}, isbn = {0-7695-2572-5}, }