Mohamed Azimane - researchr alias

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Viewing Publication 1 - 11 from 11

2012

Reducing test cost for mixed signal circuits "From TOETS to ELESIS"Mohamed Azimane. ets 2012: 1 [doi]

2007

Test quality analysis and improvement for an embedded asynchronous FIFOTobias Dubois, Erik Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters. date 2007: 859-864 [doi]

2006

High-Quality Memory TestMohamed Azimane. mtdt 2006: [doi]

2005

A New Algorithm for Dynamic Faults Detection in RAMsMohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg. vts 2005: 177-182 [doi]

Memory Testing Under Different Stress Conditions: An Industrial EvaluationAnanta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen. date 2005: 438-443 [doi]

Memory testing improvements through different stress conditionsAnanta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen. esscirc 2005: 299-302 [doi]

Word line pulsing technique for stability fault detection in SRAM cellsAndrei Pavlov, Mohamed Azimane, José Pineda de Gyvez, Manoj Sachdev. itc 2005: 10 [doi]

Programmable techniques for cell stability test and debug in embedded SRAMsAndrei Pavlov, Manoj Sachdev, José Pineda de Gyvez, Mohamed Azimane. cicc 2005: 443-446 [doi]

2004

New Test Methodology for Resistive Open Defect Detection in Memory Address DecodersMohamed Azimane, Ananta K. Majhi. vts 2004: 123-128 [doi]

2001

A special march test to detect delay coupling faults for RAMsMohamed Azimane, Antonio Lloris Ruiz. icecsys 2001: 995-999 [doi]

1998

New short and efficient algorithm for testing random-access memoriesMohamed Azimane, Antonio Lloris Ruiz. icecsys 1998: 541-544 [doi]

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