Reducing test cost for mixed signal circuits "From TOETS to ELESIS"

Mohamed Azimane. Reducing test cost for mixed signal circuits "From TOETS to ELESIS". In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.