On the Worst-Case Side-Channel Security of ECC Point Randomization in Embedded Devices

Melissa Azouaoui, François Durvaux, Romain Poussier, François-Xavier Standaert, Kostas Papagiannopoulos, Vincent Verneuil. On the Worst-Case Side-Channel Security of ECC Point Randomization in Embedded Devices. IACR Cryptology ePrint Archive, 2020:1368, 2020. [doi]

Abstract

Abstract is missing.