On the Worst-Case Side-Channel Security of ECC Point Randomization in Embedded Devices

Melissa Azouaoui, François Durvaux, Romain Poussier, François-Xavier Standaert, Kostas Papagiannopoulos, Vincent Verneuil. On the Worst-Case Side-Channel Security of ECC Point Randomization in Embedded Devices. In Karthikeyan Bhargavan, Elisabeth Oswald, Manoj Prabhakaran, editors, Progress in Cryptology - INDOCRYPT 2020 - 21st International Conference on Cryptology in India, Bangalore, India, December 13-16, 2020, Proceedings. Volume 12578 of Lecture Notes in Computer Science, pages 205-227, Springer, 2020. [doi]

Abstract

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