Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling

Toufik Azoui, Patrick Tounsi, Jean-Marie Dorkel, Jean-Michel Reynes, J. L. Massol, E. Pomes. Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling. Microelectronics Reliability, 53(9-11):1750-1754, 2013. [doi]

Abstract

Abstract is missing.