Paolo Azzoni, Andrea Fedeli, Franco Fummi, Graziano Pravadelli, Umberto Rossi, Franco Toto. An error simulation based approach to measure error coverage of formal properties. In Kanad Ghose, Patrick H. Madden, Vivek De, Peter M. Kogge, editors, Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002, New York, NY, USA, April 18-19, 2002. pages 53-58, ACM, 2002. [doi]
@inproceedings{AzzoniFFPRT02,
title = {An error simulation based approach to measure error coverage of formal properties},
author = {Paolo Azzoni and Andrea Fedeli and Franco Fummi and Graziano Pravadelli and Umberto Rossi and Franco Toto},
year = {2002},
doi = {10.1145/505306.505319},
url = {http://doi.acm.org/10.1145/505306.505319},
tags = {rule-based, coverage, systematic-approach},
researchr = {https://researchr.org/publication/AzzoniFFPRT02},
cites = {0},
citedby = {0},
pages = {53-58},
booktitle = {Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002, New York, NY, USA, April 18-19, 2002},
editor = {Kanad Ghose and Patrick H. Madden and Vivek De and Peter M. Kogge},
publisher = {ACM},
isbn = {1-58113-462-2},
}