Paolo Azzoni, Andrea Fedeli, Franco Fummi, Graziano Pravadelli, Umberto Rossi, Franco Toto. An error simulation based approach to measure error coverage of formal properties. In Kanad Ghose, Patrick H. Madden, Vivek De, Peter M. Kogge, editors, Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002, New York, NY, USA, April 18-19, 2002. pages 53-58, ACM, 2002. [doi]
Abstract is missing.