Masoud Babaie, Robert Bogdan Staszewski. A study of RF oscillator reliability in nanoscale CMOS. In 21st European Conference on Circuit Theory and Design, ECCTD 2013, Dresden, Germany, September 8-12, 2013. pages 1-4, IEEE, 2013. [doi]
@inproceedings{BabaieS13-0,
title = {A study of RF oscillator reliability in nanoscale CMOS},
author = {Masoud Babaie and Robert Bogdan Staszewski},
year = {2013},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6662205},
researchr = {https://researchr.org/publication/BabaieS13-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {21st European Conference on Circuit Theory and Design, ECCTD 2013, Dresden, Germany, September 8-12, 2013},
publisher = {IEEE},
}