Ziga Babnik, Deepak Kumar Jain 0001, Peter Peer, Vitomir Struc. 1: Observing Face Recognition Models for Efficient Quality Assessment. In IEEE International Joint Conference on Biometrics, IJCB 2025, Osaka, Japan, September 8-11, 2025. pages 1-10, IEEE, 2025. [doi]
Abstract is missing.