Jorge Bacca, Claudia V. Correa P., Edwin Vargas, Sergio Castillo, Henry Arguello. Compressive Classification from Single Pixel Measurements Via Deep Learning. In 29th IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2019, Pittsburgh, PA, USA, October 13-16, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.