Yann Bacher, Cesar Gori, Nicolas Froidevaux, Philippe Dupre, Henri Braquet, Gilles Jacquemod. Influence of supplies on fast transient burst test in microcontrollers. In IEEE 6th Latin American Symposium on Circuits & Systems, LASCAS 2015, Montevideo, Uruguay, February 24-27, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.