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Evolutionary Test Case Generation from UML-Diagram with Concurrency

Seungchan Back, Hyorin Choi, Jung-Won Lee, Byungjeong Lee. Evolutionary Test Case Generation from UML-Diagram with Concurrency. In James J. Park, Yi Pan 0001, Gangman Yi, Vincenzo Loia, editors, Advances in Computer Science and Ubiquitous Computing - CSA/CUTE 2016, Bangkok, Thailand, 19-21 December. Volume 421 of Lecture Notes in Electrical Engineering, pages 674-679, Springer, 2016. [doi]

Authors

Seungchan Back

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Hyorin Choi

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Jung-Won Lee

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Byungjeong Lee

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