Seungchan Back, Hyorin Choi, Jung-Won Lee, Byungjeong Lee. Evolutionary Test Case Generation from UML-Diagram with Concurrency. In James J. Park, Yi Pan 0001, Gangman Yi, Vincenzo Loia, editors, Advances in Computer Science and Ubiquitous Computing - CSA/CUTE 2016, Bangkok, Thailand, 19-21 December. Volume 421 of Lecture Notes in Electrical Engineering, pages 674-679, Springer, 2016. [doi]
@inproceedings{BackCLL16,
title = {Evolutionary Test Case Generation from UML-Diagram with Concurrency},
author = {Seungchan Back and Hyorin Choi and Jung-Won Lee and Byungjeong Lee},
year = {2016},
doi = {10.1007/978-981-10-3023-9_103},
url = {https://doi.org/10.1007/978-981-10-3023-9_103},
researchr = {https://researchr.org/publication/BackCLL16},
cites = {0},
citedby = {0},
pages = {674-679},
booktitle = {Advances in Computer Science and Ubiquitous Computing - CSA/CUTE 2016, Bangkok, Thailand, 19-21 December},
editor = {James J. Park and Yi Pan 0001 and Gangman Yi and Vincenzo Loia},
volume = {421},
series = {Lecture Notes in Electrical Engineering},
publisher = {Springer},
isbn = {978-981-10-3022-2},
}