Svend Back, Heiko Neumann, H. Siegfried Stiehl. On Scale-Space Edge Detection in Computed Tomograms. In Hans Burkhardt, Karl Heinz Höhne, Bernd Neumann, editors, Mustererkennung 1989, 11. DAGM-Symposium, Hamburg, 2.-4. Oktober 1989, Proceedings. Volume 219 of Informatik-Fachberichte, pages 216-223, Springer, 1989.
Abstract is missing.