Mustafa Badaroglu, Piet Wambacq, Geert Van der Plas, Stéphane Donnay, Georges G. E. Gielen, Hugo De Man. Impact of technology scaling on substrate noise generation mechanisms [mixed signal ICs]. In Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, CICC 2004, Orlando, FL, USA, October 2004. pages 501-504, IEEE, 2004. [doi]
@inproceedings{BadarogluWPDGM04-0,
title = {Impact of technology scaling on substrate noise generation mechanisms [mixed signal ICs]},
author = {Mustafa Badaroglu and Piet Wambacq and Geert Van der Plas and Stéphane Donnay and Georges G. E. Gielen and Hugo De Man},
year = {2004},
doi = {10.1109/CICC.2004.1358867},
url = {https://doi.org/10.1109/CICC.2004.1358867},
researchr = {https://researchr.org/publication/BadarogluWPDGM04-0},
cites = {0},
citedby = {0},
pages = {501-504},
booktitle = {Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, CICC 2004, Orlando, FL, USA, October 2004},
publisher = {IEEE},
isbn = {0-7803-8495-4},
}