Rohit Badjatya, N. S. Vinay, Rahul Kumar, Jaynarayan T. Tudu, Masahiro Fujita, Virendra Singh. Physical-Design Aware Scan Cell Reordering for Low Power Testing. In IEEE East-West Design & Test Symposium, EWDTS 2024, Yerevan, Armenia, November 13-17, 2024. pages 1-6, IEEE, 2024. [doi]
Abstract is missing.