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    Efficiency of Self-Test Path as a Test Pattern Generator and Test Response Compactor

    Dariusz Badura. Efficiency of Self-Test Path as a Test Pattern Generator and Test Response Compactor. In Winfried Görke, Holger Sörensen, editors, Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems, Automatisierungssysteme, Methoden, Anwendungen / Automation Systems, Methods, Applications; 4. Internationale GI/ITG/GMA-Fachtagung, Baden-Baden, 20.-22. September 1989, Proceedings. Volume 214 of Informatik-Fachberichte, pages 368-378, Springer, 1989.

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