Efficient TSV Fault Detection Scheme For High Bandwidth Memory Using Pattern Analysis

Kwanho Bae, Jongsun Park. Efficient TSV Fault Detection Scheme For High Bandwidth Memory Using Pattern Analysis. In International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020. pages 19-20, IEEE, 2020. [doi]

Authors

Kwanho Bae

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Jongsun Park

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