Kwanho Bae, Jongsun Park. Efficient TSV Fault Detection Scheme For High Bandwidth Memory Using Pattern Analysis. In International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020. pages 19-20, IEEE, 2020. [doi]
@inproceedings{BaeP20,
title = {Efficient TSV Fault Detection Scheme For High Bandwidth Memory Using Pattern Analysis},
author = {Kwanho Bae and Jongsun Park},
year = {2020},
doi = {10.1109/ISOCC50952.2020.9333115},
url = {https://doi.org/10.1109/ISOCC50952.2020.9333115},
researchr = {https://researchr.org/publication/BaeP20},
cites = {0},
citedby = {0},
pages = {19-20},
booktitle = {International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8331-2},
}