SRAM stability design comprehending 14nm FinFET reliability

Choelhwyi Bae, Sangwoo Pae, Cheong-sik Yu, Kangjung Kim, Yongshik Kim, Jongwoo Park. SRAM stability design comprehending 14nm FinFET reliability. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 13, IEEE, 2015. [doi]

Abstract

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