Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals

Sanghyeon Baeg, Shi-Jie Wen, Richard Wong. Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. on Circuits and Systems, 57-I(4):814-822, 2010. [doi]

Authors

Sanghyeon Baeg

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Shi-Jie Wen

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Richard Wong

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