Sanghyeon Baeg, Shi-Jie Wen, Richard Wong. Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. on Circuits and Systems, 57-I(4):814-822, 2010. [doi]
@article{BaegWW10,
title = {Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals},
author = {Sanghyeon Baeg and Shi-Jie Wen and Richard Wong},
year = {2010},
doi = {10.1109/TCSI.2009.2025856},
url = {http://dx.doi.org/10.1109/TCSI.2009.2025856},
researchr = {https://researchr.org/publication/BaegWW10},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {57-I},
number = {4},
pages = {814-822},
}