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Rapid Measurement of Soybean Seed Viability Using Kernel-Based Multispectral Image Analysis

In-Suck Baek, Dewi Kusumaningrum, Lalit Mohan Kandpal, Santosh Lohumi, Changyeun Mo, Moon S. Kim, Byoung-Kwan Cho. Rapid Measurement of Soybean Seed Viability Using Kernel-Based Multispectral Image Analysis. Sensors, 19(2):271, 2019. [doi]

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