Dusan Baek, Jong-Hwan Shin, Byungjeong Lee, Jung-Won Lee. Defect Management Method for Content-based Document Artifact Test in Software R&D Project. In James J. Park, Vincenzo Loia, Gangman Yi, Yunsick Sung, editors, Advances in Computer Science and Ubiquitous Computing - CSA/CUTE 2017, Taichung, Taiwan, 18-20 December. Volume 474 of Lecture Notes in Electrical Engineering, pages 1192-1198, Springer, 2017. [doi]
Abstract is missing.