Reliability Study of Strained Silicon SOI TFET

Urmila Bag, Brinda Bhowmick, Rajesh Saha, Puspa Devi Pukhrambam. Reliability Study of Strained Silicon SOI TFET. In 2025 5th International Conference on Electrical, Computer and Energy Technologies (ICECET), Paris, France, July 3-6, 2025. pages 1-6, IEEE, 2025. [doi]

Abstract

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