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Destructive events in NAND Flash memories irradiated with heavy ions

M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen. Destructive events in NAND Flash memories irradiated with heavy ions. Microelectronics Reliability, 50(9-11):1832-1836, 2010. [doi]

Authors

M. Bagatin

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Simone Gerardin

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Alessandro Paccagnella

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G. Cellere

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F. Irom

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D. N. Nguyen

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