M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen. Destructive events in NAND Flash memories irradiated with heavy ions. Microelectronics Reliability, 50(9-11):1832-1836, 2010. [doi]
@article{BagatinGPCIN10,
title = {Destructive events in NAND Flash memories irradiated with heavy ions},
author = {M. Bagatin and Simone Gerardin and Alessandro Paccagnella and G. Cellere and F. Irom and D. N. Nguyen},
year = {2010},
doi = {10.1016/j.microrel.2010.07.032},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.032},
researchr = {https://researchr.org/publication/BagatinGPCIN10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1832-1836},
}