M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen. Destructive events in NAND Flash memories irradiated with heavy ions. Microelectronics Reliability, 50(9-11):1832-1836, 2010. [doi]
@article{BagatinGPCIN10, title = {Destructive events in NAND Flash memories irradiated with heavy ions}, author = {M. Bagatin and Simone Gerardin and Alessandro Paccagnella and G. Cellere and F. Irom and D. N. Nguyen}, year = {2010}, doi = {10.1016/j.microrel.2010.07.032}, url = {http://dx.doi.org/10.1016/j.microrel.2010.07.032}, researchr = {https://researchr.org/publication/BagatinGPCIN10}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {50}, number = {9-11}, pages = {1832-1836}, }