Nooshin Bahador, Kristo Erikson, Jouko Laurila, Juha Koskenkari, Tero Ala-Kokko, Jukka Kortelainen. Automatic detection of artifacts in EEG by combining deep learning and histogram contour processing. In 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society, EMBC 2020, Montreal, QC, Canada, July 20-24, 2020. pages 138-141, IEEE, 2020. [doi]
Abstract is missing.