Self-Programmable Shared BIST for Testing Multiple Memories

Swapnil Bahl, Vishal Srivastava. Self-Programmable Shared BIST for Testing Multiple Memories. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 91-96, IEEE Computer Society, 2008. [doi]

Abstract

Abstract is missing.