Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi. Special Session: Security Verification & Testing for SR-Latch TRNGs. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-10, IEEE, 2023. [doi]
@inproceedings{BahramiEDGK23,
title = {Special Session: Security Verification & Testing for SR-Latch TRNGs},
author = {Javad Bahrami and Mohammad Ebrahimabadi and Jean-Luc Danger and Sylvain Guilley and Naghmeh Karimi},
year = {2023},
doi = {10.1109/VTS56346.2023.10140057},
url = {https://doi.org/10.1109/VTS56346.2023.10140057},
researchr = {https://researchr.org/publication/BahramiEDGK23},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4630-5},
}