Sudarshan Bahukudumbi, Krishna Bharath. A Low Overhead High Speed Histogram Based Test Methodology for Analog Circuits and IP Cores. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 804-807, IEEE Computer Society, 2005. [doi]
Abstract is missing.